Using Body Bias in High Performance, Low Power Electronics

Using Body Bias in High Performance, Low Power Electronics

By Flint Yoder – Mentor, A Siemens Business The body bias effect is used to tune circuit behavior to meet…

The Chicken or the Egg? Finding Litho Hotspots Before Design Rules Exist

The Chicken or the Egg? Finding Litho Hotspots Before Design Rules Exist

By Wael ElManhawy and Joe Kwan – Mentor, A Siemens Business Which comes first, accurate design rules or real designs?…

How Mentor is Helping You Make Silicon Photonics a $1.3B market by 2022

How Mentor is Helping You Make Silicon Photonics a $1.3B market by 2022

By Michael Buehler-Garcia, Senior Director, D2S Calibre Marketing – Mentor, A Siemens Business Companies who want to explore the potential…

Now You See Them…Now You Don’t: Recognizing DP Errors at Advanced Nodes

Now You See Them…Now You Don’t: Recognizing DP Errors at Advanced Nodes

By David Abercrombie and Alex Pearson – Mentor, A Siemens Business At advanced nodes, designers need enhanced error visualization and…

Calibre Collaboration and Innovation on Display at TSMC OIP Santa Clara

Calibre Collaboration and Innovation on Display at TSMC OIP Santa Clara

At the TSMC Open Innovation Platform® (OIP) event in Santa Clara on September 13, Mentor was privileged to co-present with…

GIGO, or Why Data Integrity Matters

GIGO, or Why Data Integrity Matters

By James Paris – Mentor, A Siemens Business Design data integrity is crucial to both product quality and tapeout schedules….

Node Migration—What Does it Really Cost You?

Node Migration—What Does it Really Cost You?

By John Ferguson – Mentor, A Siemens Business Deciding when and how to make a process node transition is critical…

CMP Modeling: Improving Manufacturing Results during Design

CMP Modeling: Improving Manufacturing Results during Design

By Jeff Wilson and Ruben Ghulghazaryan – Mentor, A Siemens Business Accurate CMP models and simulation are crucial to both design process…

The Speed of Reliability

The Speed of Reliability

By Dina Medhat – Mentor, A Siemens Business Electrical overstress (EOS) can damage or destroy an IC. The Calibre PERC…