By Karen Chow, Mentor Graphics Accurate and efficient FinFET characterization requires a parasitic extraction tool that can apply different extraction…
By Carey Robertson and Steve Pateras, Mentor Graphics Are your processes ready for finFETs?
By Carey Robertson, Mentor Graphics With circuit performance driven by capacitance values, accurate calculations are critical for MEMs designers.
By Karen Chow, Mentor Graphics How does multi-patterning impact parasitic extraction? How many corners do you really need?
