Thought Leadership

Self-testing in embedded systems article – part 2

March 21, 2016 • 2 MIN READ
By Colin Walls

My latest article in embedded.com is the second instalment of a two-part piece:

Self-testing in embedded systems

All electronic systems carry the possibility of failure. An embedded system has intrinsic intelligence that facilitates the possibility of predicting failure and mitigating its effects. This article reviews the options for self-testing that are open to the embedded software developer, along with testing algorithms for memory and some ideas for self-monitoring software in multi-tasking and multi-CPU systems.

This second and concluding part concentrates on dealing with software failure.

Colin Walls

I have over thirty years experience in the electronics industry, largely dedicated to embedded software. A frequent presenter at conferences and seminars and author of numerous technical articles and two books on embedded software, I am a member of the marketing team of the Mentor Graphics Embedded Systems Division, and am based in the UK. Away from work, I have a wide range of interests including photography and trying to point my two daughters in the right direction in life. Learn more about Colin, including his go-to karaoke song and the best parts of being British: http://go.mentor.com/3_acv

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This article first appeared on the Siemens Digital Industries Software blog at https://blogs.stage.sw.siemens.com/embedded-software/2016/03/21/self-testing-in-embedded-systems-article-part-2/