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Mentor and Ambarella present: Automotive IC test web seminar

Ambarella used the Tessent software Safety ecosystem to successfully meet in-system test requirements and achieve ISO26262 automotive safety integrity level (ASIL) goals for its CV22FS and CV2FS automotive camera SoCs.

(Read the news release here.)

Now Ambarella and Mentor are hosting this one-hour, live online web seminar on July 7 and you are invited.

Tessent Safety – Entering the Safety Ecosystem: a reference flow for automotive IC test

  • July 7, 2020 – Online, 8:00 AM US/Pacific

Register now

We decided to offer this seminar because more and more designs are required to meet the strict safety targets for electronic devices used in safety-critical applications as specified in the ISO 26262 standard.

This introduction to the Tessent Automotive reference flow describes a complete usage model for deploying Mentor DFT and test solution for your automotive IC. Our experts describe the implementation of Tessent Shell Flow to meet the quality and reliability requirements of the ISO 26262 standard through both manufacturing and in-system chip testing and diagnosis. The goal of this webinar is to highlight the key steps in achieving the right DFT strategy for automotive safety in the early stages of your design implementation.

We review the overall design flow and methodologies that can be used to fulfill automotive IC requirements. We will also talk about technologies and best practices used to achieve the safety required for use in level 3+ autonomous vehicles. The seminar includes group chat and a Q&A with the experts from Mentor and Ambarella.

Agenda for the live web-based seminar:

  • Introduction to the Tessent Automotive technologies are available as part of the Tessent Safety Eco System
  • Automotive requirements
  • Mapping automotive to BIST
  • Safe IP creation
  • Safety Island
  • Automotive-grade ATPG
  • SOC integration
  • Conclusion
  • Q&A

Register now!

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This article first appeared on the Siemens Digital Industries Software blog at https://blogs.stage.sw.siemens.com/tessent/2020/07/02/mentor-and-ambarella-present-automotive-ic-test-web-seminar/