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Tessent earns TSMC OIP Partner of the Year for 3DFabric collaboration

December 1, 2021

Recognition of Tessent’s excellence in next-generation system-on-chip and 3DIC design enablement. Siemens EDA takes industry partnerships seriously, and sometimes we…

By Tessent Solutions
< 1 MIN READ
Pattern Matching in Test and Yield Analysis

Pattern Matching in Test and Yield Analysis

August 1, 2016

By Geir Eide and Jonathan Muirhead Analyzing fail data with pattern matching helps companies identify yield limiters faster to increase…

By Tessent Solutions
4 MIN READ