{"id":690,"date":"2019-04-23T10:29:05","date_gmt":"2019-04-23T17:29:05","guid":{"rendered":"http:\/\/blogs.mentor.com\/tessent\/?p=690"},"modified":"2019-04-23T10:29:05","modified_gmt":"2019-04-23T17:29:05","slug":"test-for-the-autonomous-age","status":"publish","type":"post","link":"https:\/\/blogs.stage.sw.siemens.com\/tessent\/2019\/04\/23\/test-for-the-autonomous-age\/","title":{"rendered":"Test for the Autonomous Age"},"content":{"rendered":"

Move over, Information Age\u2014the Autonomous Age is on its way. In the autonomous age, information is not just copious and accessible, it is integrated into our daily lives to automatically augment human capabilities. In the autonomous age, we expect technology to comprehend and take action.<\/em><\/p>\n

One of the material drivers of the autonomous age includes integrated circuits (ICs) that can handle every increasing demand for data processing. The ICs that will power autonomous electronic systems, whether in industrial AI systems or autonomous vehicles, present semiconductor designers with unique challenges.<\/p>\n

For example, ICs for the autonomous age are very large, complex designs that often use new architectures. They are also designed to be used in applications that have no tolerance for failure in the electronics, like autonomous vehicles.<\/p>\n

How will the industry achieve high IC quality, make sure the ICs are manufacturable with acceptable yield, and meet the functional safety requirements for ICs for automotive, medical, industrial, military, and other uses? Also, how can the players in the market shrink IC implementation time in order to be competitive?<\/p>\n

Mentor\u2019s DFT, test, and yield experts have defined three key test challenges for ICs in the autonomous age:<\/p>\n