User conferences are a great way to network and learn from your peers. This year, for the first time, we are…
As a Tessent user, you’re probably familiar with Tessent TestKompress and Tessent LBIST (logic built-in self-test) for Logic BIST insertion….
The bring-up process of integrated circuits (ICs) involves several iterations through multiple steps spanning design, DFT (Design for Test), and…
Did you ever wonder how to make something good out of something bad? Of course, you have! I’m sure after…
“Now where did I put my keys?” It doesn’t have to be keys. It could be glasses, cell phone, purse,…
Finding manufacturing defects in integrated circuit (IC) chips is hard to do. Automatic test pattern generation (ATPG) and on-chip compression…
